X-ray scattering study of Ag/Si(111) buried interface structures

Phys Rev Lett. 1992 Jan 27;68(4):507-510. doi: 10.1103/PhysRevLett.68.507.

Authors

H Hong, RD Aburano, D Lin, H Chen, T Chiang, P Zschack, ED Specht

PMID: 10045914
DOI: 10.1103/PhysRevLett.68.507

No abstract available