A storage Dewar near-field scanning optical microscope

Ultramicroscopy. 2000 May;83(1-2):25-31. doi: 10.1016/s0304-3991(99)00167-9.

Abstract

A near-field scanning optical microscope for operation within a storage Dewar is described. It was designed for studies of opaque samples and operates in the collection mode. Illumination can be either through the tip or from the side via a separate fiber. Scans can be begun within 2 h after start of cooldown. Its rigid design allows high resolution and long scans with no additional vibration isolation. To illustrate its performance, measurements of photoluminescence in GaAs/AlGaAs heterostructures are presented. The signal and noise levels for the two illumination modes are examined.