This work demonstrates the feasibility of a novel scintillation detector with greater detection efficiency than that of chevron-type microchannel plate (MCP) detectors. The detection mechanism involves sequential conversion reactions induced by ion-surface impacts. Identical detection conditions can be utilized to monitor both positive and negative ions in mass spectrometers. The proposed detector comprises an ion beam guiding device, a negatively biased washer-shaped conversion dynode, and an aluminum-coated scintillation detector. The beam guide changes the electric field around the washer-shaped conversion dynode, and it allows the primary and secondary ions to propagate toward the scintillation phosphor and the conversion dynode, respectively. The detection is achieved by the detection of electron-induced luminescence on a phosphor. The amplification efficiency of this bipolar ion detector increases as the conversion dynode voltage increases. For ions with a mass-to-charge ratio of up to 90 000, the sensitivity of the BID is 1.4-14.4 times that of the MCP. Further improvement of the sensitivity can be achieved by increasing the conversion dynode voltage or the ion acceleration voltage. Results of this study demonstrate that this detector is a promising alternative for efficient ion detection.