Application of a charge-coupled device photon-counting technique to three-dimensional element analysis of a plant seed (alfalfa) using a full-field x-ray fluorescence imaging microscope

Rev Sci Instrum. 2007 Jul;78(7):073706. doi: 10.1063/1.2756632.

Abstract

A full-field x-ray fluorescence imaging microscope using a Wolter mirror was constructed at Photon Factory BL3C2. White x rays from a bending magnet were used to excite x-ray fluorescence and to enhance the x-ray fluorescence intensity. A photon-counting method using a charge-coupled device was applied to obtain an x-ray fluorescence spectrum at the image plane. The spatial distributions of some specific atoms such as Fe and Zn were obtained from photon-counting calculations. An energy resolution of 220 eV at the Fe Kalpha line was obtained from the x-ray fluorescence spectrum by the photon-counting method. The newly developed three-dimensional element mappings of the specific atoms were accomplished by the photon-counting method and a reconstruction technique using computed tomography.

Publication types

  • Evaluation Study

MeSH terms

  • Equipment Design
  • Equipment Failure Analysis
  • Imaging, Three-Dimensional / instrumentation*
  • Imaging, Three-Dimensional / methods
  • Medicago sativa / chemistry*
  • Microscopy, Fluorescence / instrumentation*
  • Microscopy, Fluorescence / methods
  • Photons
  • Radiation Dosage
  • Radiometry / instrumentation*
  • Radiometry / methods
  • Reproducibility of Results
  • Seeds / chemistry*
  • Sensitivity and Specificity
  • Spectrometry, X-Ray Emission / instrumentation*
  • Spectrometry, X-Ray Emission / methods
  • Static Electricity