In-plane rotation analysis by two-wavelength electronic speckle interferometry

Appl Opt. 1999 Apr 20;38(12):2467-70. doi: 10.1364/ao.38.002467.

Abstract

A simple method is presented for the measurement of in-plane rotation (angle and sign) of an object by use of the conventional in-plane sensitive electronic speckle pattern interferometry technique combined with the two-wavelength laser diode method. The advantage of this method is that it can be used to measure the angle of rotation in a simple way by determination of fringe tilt. The experimental setup is described, and results are presented.