Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

Phys Rev Lett. 2008 Sep 5;101(10):107602. doi: 10.1103/PhysRevLett.101.107602. Epub 2008 Sep 4.

Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.