Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271.

Abstract

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) - PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of < or =1 microm. Observations were correlated with simulations of best focus to provide further relevant information.

Publication types

  • Research Support, Non-U.S. Gov't
  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Computer-Aided Design
  • Electrons
  • Equipment Design
  • Equipment Failure Analysis
  • Lasers*
  • Lenses*
  • Materials Testing / instrumentation*
  • Materials Testing / methods*
  • Reproducibility of Results
  • Sensitivity and Specificity
  • X-Ray Diffraction / instrumentation*
  • X-Ray Diffraction / methods*