The multiple-input maximum a-posteriori (MIMAP) wave-function restoration method in high-resolution electron microscopy proposed by Kirkland (1984) is further discussed. A modified MIMAP criterion that considers likely correlations between individual micrographs in a series of micrographs taken at different imaging conditions is presented. By performing wave-function restoration for a multislice method-simulated defocus series of MgO[110], the convergent properties of this modified MIMAP method are also described.