Current pinhole x ray imaging at the National Ignition Facility (NIF) is limited in resolution and signal throughput to the detector for Inertial Confinement Fusion applications, due to the viable range of pinhole sizes (10-25 μm) that can be deployed. A higher resolution and throughput diagnostic is in development using a Kirkpatrick-Baez microscope system (KBM). The system will achieve <9 μm resolution over a 300 μm field of view with a multilayer coating operating at 10.2 keV. Presented here are the first images from the uncoated NIF KBM configuration demonstrating high resolution has been achieved across the full 300 μm field of view.