Machine learning enabled fast optical identification and characterization of 2D materials

Polina A Leger; Aditya Ramesh; Talianna Ulloa; Yingying Wu

doi:10.1038/s41598-024-79386-z

Machine learning enabled fast optical identification and characterization of 2D materials

Sci Rep. 2024 Nov 13;14(1):27808. doi: 10.1038/s41598-024-79386-z.

Authors

Polina A Leger¹, Aditya Ramesh¹, Talianna Ulloa¹, Yingying Wu²

Affiliations

¹ Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida, 32611, USA.
² Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida, 32611, USA. yingyingwu@ufl.edu.

Abstract

Two-dimensional materials are a class of atomically thin materials with assorted electronic and quantum properties. Accurate identification of layer thickness, especially for a single monolayer, is crucial for their characterization. This characterization process, however, is often time-consuming, requiring highly skilled researchers and expensive equipment like atomic force microscopy. This project aims to streamline the identification process by using machine learning to analyze optical images and quickly determine layer thickness. In this paper, we evaluate the performance of three machine learning models - SegNet, 1D U-Net, and 2D U-Net- in accurately identifying monolayers in microscopic images. Additionally, we explore labeling and image processing techniques to determine the most effective and accessible method for identifying layer thickness in this class of materials.