Previous studies have reported cytoarchitectural abnormalities in superficial laminae of rostral portions of the entorhinal cortex in schizophrenia, including decreased densities of neurons, poorly formed layer II neuron islands, and apparent displacement of layer II-type neurons deep into layer III; however, findings have been controversial, given the qualitative nature of the descriptions and the normal heterogeneity of cytoarchitecture of the region. The x, y coordinates of Nissl-stained neurons were mapped in layers II, III, and V of entorhinal subdivision ER in 8 prospectively accrued patients with schizophrenia and 8 nonneuropsychiatric controls. Indices of neuron dispersion, nearest neighbor distances, and effective radius were determined. An abnormally clustered dispersion of neurons in layer III was present in schizophrenics compared to controls along with a reduced neuron effective radius, whereas the mean nearest-neighbor distance was normal. In layer II, there was a significantly increased effective radius, whereas other indices were normal. No between-group differences were noted in layer V for any variable. These data provide further evidence for subtle aberrant cytoarchitecture in superficial laminae of the entorhinal cortex in schizophrenia and are consistent with neurodevelopmental models of abnormal neuronal pruning, "miswiring," and/or migration in the illness.