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Page 1
Femtosecond time-delay X-ray holography.
Chapman HN, Hau-Riege SP, Bogan MJ, Bajt S, Barty A, Boutet S, Marchesini S, Frank M, Woods BW, Benner WH, London RA, Rohner U, Szöke A, Spiller E, Möller T, Bostedt C, Shapiro DA, Kuhlmann M, Treusch R, Plönjes E, Burmeister F, Bergh M, Caleman C, Huldt G, Seibert MM, Hajdu J. Chapman HN, et al. Among authors: woods bw. Nature. 2007 Aug 9;448(7154):676-9. doi: 10.1038/nature06049. Nature. 2007. PMID: 17687320 Free article.
Random phase plates for beam smoothing on the Nova laser.
Dixit SN, Thomas IM, Woods BW, Morgan AJ, Henesian MA, Wegner PJ, Powell HT. Dixit SN, et al. Among authors: woods bw. Appl Opt. 1993 May 10;32(14):2543-54. doi: 10.1364/AO.32.002543. Appl Opt. 1993. PMID: 20820416
Single particle X-ray diffractive imaging.
Bogan MJ, Benner WH, Boutet S, Rohner U, Frank M, Barty A, Seibert MM, Maia F, Marchesini S, Bajt S, Woods B, Riot V, Hau-Riege SP, Svenda M, Marklund E, Spiller E, Hajdu J, Chapman HN. Bogan MJ, et al. Nano Lett. 2008 Jan;8(1):310-6. doi: 10.1021/nl072728k. Epub 2007 Dec 21. Nano Lett. 2008. PMID: 18095739
Multipurpose modular experimental station for the DiProI beamline of Fermi@Elettra free electron laser.
Pedersoli E, Capotondi F, Cocco D, Zangrando M, Kaulich B, Menk RH, Locatelli A, Mentes TO, Spezzani C, Sandrin G, Bacescu DM, Kiskinova M, Bajt S, Barthelmess M, Barty A, Schulz J, Gumprecht L, Chapman HN, Nelson AJ, Frank M, Pivovaroff MJ, Woods BW, Bogan MJ, Hajdu J. Pedersoli E, et al. Among authors: woods bw. Rev Sci Instrum. 2011 Apr;82(4):043711. doi: 10.1063/1.3582155. Rev Sci Instrum. 2011. PMID: 21529017
Experimental comparison of a Shack-Hartmann sensor and a phase-shifting interferometer for large-optics metrology applications.
Koch JA, Presta RW, Sacks RA, Zacharias RA, Bliss ES, Dailey MJ, Feldman M, Grey AA, Holdener FR, Salmon JT, Seppala LG, Toeppen JS, Van Atta L, Van Wonterghem BM, Whistler WT, Winters SE, Woods BW. Koch JA, et al. Among authors: woods bw. Appl Opt. 2000 Sep 1;39(25):4540-6. doi: 10.1364/ao.39.004540. Appl Opt. 2000. PMID: 18350042