Kaneyama T - Search Results

1

Nanoanalysis by a high-resolution energy filtering transmission electron microscope.

Mitome M, Bando Y, Golberg D, Kurashima K, Okura Y, Kaneyama T, Naruse M, Honda Y. Mitome M, et al. Among authors: kaneyama t. Microsc Res Tech. 2004 Feb 15;63(3):140-8. doi: 10.1002/jemt.20025. Microsc Res Tech. 2004. PMID: 14755600

2

A new 200 kV Omega-filter electron microscope.

Tanaka M, Tsuda K, Terauchi M, Tsuno K, Kaneyama T, Honda T, Ishida M. Tanaka M, et al. Among authors: kaneyama t. J Microsc. 1999 Apr;194(1):219-227. doi: 10.1046/j.1365-2818.1999.00446.x. J Microsc. 1999. PMID: 10320556

3

Electron microscopy at a sub-50 pm resolution.

Takayanagi K, Kim S, Lee S, Oshima Y, Tanaka T, Tanishiro Y, Sawada H, Hosokawa F, Tomita T, Kaneyama T, Kondo Y. Takayanagi K, et al. Among authors: kaneyama t. J Electron Microsc (Tokyo). 2011;60 Suppl 1:S239-44. doi: 10.1093/jmicro/dfr048. J Electron Microsc (Tokyo). 2011. PMID: 21844593

4

High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of bulk and nanoparticle LaB6 in the near-infrared region.

Sato Y, Terauchi M, Mukai M, Kaneyama T, Adachi K. Sato Y, et al. Among authors: kaneyama t. Ultramicroscopy. 2011 Jul;111(8):1381-7. doi: 10.1016/j.ultramic.2011.05.003. Epub 2011 May 14. Ultramicroscopy. 2011. PMID: 21864781

5

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.

Sawada H, Tanishiro Y, Ohashi N, Tomita T, Hosokawa F, Kaneyama T, Kondo Y, Takayanagi K. Sawada H, et al. Among authors: kaneyama t. J Electron Microsc (Tokyo). 2009 Dec;58(6):357-61. doi: 10.1093/jmicro/dfp030. Epub 2009 Jun 22. J Electron Microsc (Tokyo). 2009. PMID: 19546144

6

Development of a monochromator for aberration-corrected scanning transmission electron microscopy.

Mukai M, Okunishi E, Ashino M, Omoto K, Fukuda T, Ikeda A, Somehara K, Kaneyama T, Saitoh T, Hirayama T, Ikuhara Y. Mukai M, et al. Among authors: kaneyama t. Microscopy (Oxf). 2015 Jun;64(3):151-8. doi: 10.1093/jmicro/dfv001. Epub 2015 Feb 5. Microscopy (Oxf). 2015. PMID: 25654985

7

Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage.

Suenaga K, Sato Y, Liu Z, Kataura H, Okazaki T, Kimoto K, Sawada H, Sasaki T, Omoto K, Tomita T, Kaneyama T, Kondo Y. Suenaga K, et al. Among authors: kaneyama t. Nat Chem. 2009 Aug;1(5):415-8. doi: 10.1038/nchem.282. Epub 2009 Jul 5. Nat Chem. 2009. PMID: 21378897

8

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.

Sasaki T, Sawada H, Hosokawa F, Kohno Y, Tomita T, Kaneyama T, Kondo Y, Kimoto K, Sato Y, Suenaga K. Sasaki T, et al. Among authors: kaneyama t. J Electron Microsc (Tokyo). 2010 Aug;59 Suppl 1:S7-13. doi: 10.1093/jmicro/dfq027. Epub 2010 Jun 27. J Electron Microsc (Tokyo). 2010. PMID: 20581425

9

Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun.

Kim S, Oshima Y, Sawada H, Kaneyama T, Kondo Y, Takeguchi M, Nakayama Y, Tanishiro Y, Takayanagi K. Kim S, et al. Among authors: kaneyama t. J Electron Microsc (Tokyo). 2011;60(2):109-16. doi: 10.1093/jmicro/dfq084. Epub 2011 Jan 19. J Electron Microsc (Tokyo). 2011. PMID: 21247969

10

Measurement method of aberration from Ronchigram by autocorrelation function.

Sawada H, Sannomiya T, Hosokawa F, Nakamichi T, Kaneyama T, Tomita T, Kondo Y, Tanaka T, Oshima Y, Tanishiro Y, Takayanagi K. Sawada H, et al. Among authors: kaneyama t. Ultramicroscopy. 2008 Oct;108(11):1467-75. doi: 10.1016/j.ultramic.2008.04.095. Epub 2008 Jun 19. Ultramicroscopy. 2008. PMID: 18715716

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