Measurement of the inclusive semielectronic D0 branching fraction.
Kubota Y, Lattery M, Nelson JK, Patton S, Poling R, Riehle T, Savinov V V, Wang R, Alam MS, Kim IJ, Ling Z, Mahmood AH, O'Neill JJ, Severini H, Sun CR, Timm S, Wappler F, Crawford G, Duboscq JE, Fulton R, Fujino D, Gan KK, Honscheid K, Kagan H, Kass R, Lee J, Sung M, White C, Wanke R, Wolf A, Zoeller MM, Fu X, Nemati B, Ross WR, Skubic P, Wood M, Bishai M, Fast J, Gerndt E, Hinson JW, Miao T, Miller DH, Modesitt M, Shibata EI, Shipsey IP, Wang PN, Gibbons L, Johnson SD, Kwon Y, Roberts S, Thorndike EH, Coan TE, Dominick J, Fadeyev V V, Korolkov I I, Lambrecht M, Sanghera S, Shelkov V V, Stroynowski R, Volobouev I I, Wei G, Artuso M, Gao M, Goldberg M.
Kubota Y, et al. Among authors: gibbons l.
Phys Rev D Part Fields. 1996 Sep 1;54(5):2994-3005. doi: 10.1103/physrevd.54.2994.
Phys Rev D Part Fields. 1996.
PMID: 10020978
No abstract available.