Walton CC - Search Results

1

Sub-diffraction-limited multilayer coatings for the 0.3 numerical aperture micro-exposure tool for extreme ultraviolet lithography.

Soufli R, Hudyma RM, Spiller E, Gullikson EM, Schmidt MA, Robinson JC, Baker SL, Walton CC, Taylor JS. Soufli R, et al. Among authors: walton cc. Appl Opt. 2007 Jun 20;46(18):3736-46. doi: 10.1364/ao.46.003736. Appl Opt. 2007. PMID: 17538670

2

Atomic-precision multilayer coating of the first set of optics for an extreme-ultraviolet lithography prototype system.

Montcalm C, Grabner RF, Hudyma RM, Schmidt MA, Spiller E, Walton CC, Wedowski M, Folta JA. Montcalm C, et al. Among authors: walton cc. Appl Opt. 2002 Jun 1;41(16):3262-9. doi: 10.1364/ao.41.003262. Appl Opt. 2002. PMID: 12064411

3

Lifetime Stability and Microstructure Properties of Cr/B₄C X-ray Reflective Multilayer Coatings.

Burcklen C, Soufli R, Rebellato J, Walton C, Meltchakov E, Rault JE, Gullikson E, Delmotte F. Burcklen C, et al. J Nanosci Nanotechnol. 2019 Jan 1;19(1):554-561. doi: 10.1166/jnn.2019.16480. J Nanosci Nanotechnol. 2019. PMID: 30327069

4

Normal-incidence reflectance of optimized W /B(4) C x-ray multilayers in the range 1.4 nm < l > 2.4 nm.

Windt DL, Gullikson EM, Walton CC. Windt DL, et al. Among authors: walton cc. Opt Lett. 2002 Dec 15;27(24):2212-4. doi: 10.1364/ol.27.002212. Opt Lett. 2002. PMID: 18033486

5

Depth-graded Mo/Si multilayer coatings for hard x-rays.

Burcklen C, Pardini T, Alameda J, Robinson J, Platonov Y, Walton C, Soufli R. Burcklen C, et al. Opt Express. 2019 Mar 4;27(5):7291-7306. doi: 10.1364/OE.27.007291. Opt Express. 2019. PMID: 30876295 Free article.

6

Aperiodic Mo/Si multilayers for hard x-rays.

Pardini T, Alameda J, Platonov Y, Robinson J, Soufli R, Spiller E, Walton C, Hau-Riege SP. Pardini T, et al. Opt Express. 2016 Aug 8;24(16):18642-8. doi: 10.1364/OE.24.018642. Opt Express. 2016. PMID: 27505826 Free article.

7

In Situ Real-Time Radiographic Study of Thin Film Formation Inside Rotating Hollow Spheres.

Braun T, Walton CC, Dawedeit C, Biener MM, Kim SH, Willey TM, Xiao X, van Buuren A, Hamza AV, Biener J. Braun T, et al. Among authors: walton cc. ACS Appl Mater Interfaces. 2016 Feb 3;8(4):2600-6. doi: 10.1021/acsami.5b10357. Epub 2016 Jan 21. ACS Appl Mater Interfaces. 2016. PMID: 26717408

8

A Kirkpatrick-Baez microscope for the National Ignition Facility.

Pickworth LA, McCarville T, Decker T, Pardini T, Ayers J, Bell P, Bradley D, Brejnholt NF, Izumi N, Mirkarimi P, Pivovaroff M, Smalyuk V, Vogel J, Walton C, Kilkenny J. Pickworth LA, et al. Rev Sci Instrum. 2014 Nov;85(11):11D611. doi: 10.1063/1.4886433. Rev Sci Instrum. 2014. PMID: 25430187

9

The National Ignition Facility modular Kirkpatrick-Baez microscope.

Pickworth LA, Ayers J, Bell P, Brejnholt NF, Buscho JG, Bradley D, Decker T, Hau-Riege S, Kilkenny J, McCarville T, Pardini T, Vogel J, Walton C. Pickworth LA, et al. Rev Sci Instrum. 2016 Nov;87(11):11E316. doi: 10.1063/1.4960417. Rev Sci Instrum. 2016. PMID: 27910471

10

A Wolter imager on the Z machine to diagnose warm x-ray sources.

Fein JR, Ampleford DJ, Vogel JK, Kozioziemski B, Walton CC, Wu M, Ball CR, Ames A, Ayers J, Bell P, Bourdon CJ, Bradley D, Bruni R, Dunham GS, Gard PD, Johnson D, Kilaru K, Kirtley C, Lake PW, Maurer A, Nielsen-Weber L, Pickworth LA, Pivovaroff MJ, Ramsey B, Roberts OJ, Rochau GA, Romaine S, Sullivan M. Fein JR, et al. Among authors: walton cc. Rev Sci Instrum. 2018 Oct;89(10):10G115. doi: 10.1063/1.5038347. Rev Sci Instrum. 2018. PMID: 30399891

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