Bhaskaran M - Search Results

1

Surface morphology induced localized electric field and piezoresponse enhancement in nanostructured thin films.

Sriram S, Bhaskaran M, Ahluwalia R, Nguyen TG, Ng N, Srolovitz DJ, Kalantar-Zadeh K, Mitchell A. Sriram S, et al. Among authors: bhaskaran m. ACS Nano. 2011 Feb 22;5(2):1067-72. doi: 10.1021/nn103561u. Epub 2011 Jan 27. ACS Nano. 2011. PMID: 21271737

2

Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.

Bhaskaran M, Sriram S, Holland AS, Evans PJ. Bhaskaran M, et al. Micron. 2009 Jan;40(1):99-103. doi: 10.1016/j.micron.2007.12.008. Epub 2008 Jan 6. Micron. 2009. PMID: 18276146

3

Influence of oxygen partial pressure on the composition and orientation of strontium-doped lead zirconate titanate thin films.

Sriram S, Bhaskaran M, du Plessis J, Short KT, Sivan VP, Holland AS. Sriram S, et al. Among authors: bhaskaran m. Micron. 2009 Jan;40(1):104-8. doi: 10.1016/j.micron.2007.12.009. Epub 2008 Jan 6. Micron. 2009. PMID: 18276147

4

Thin film piezoelectric response characterisation using atomic force microscopy with standard contact mode imaging.

Sriram S, Bhaskaran M, Short KT, Matthews GI, Holland AS. Sriram S, et al. Among authors: bhaskaran m. Micron. 2009 Jan;40(1):109-13. doi: 10.1016/j.micron.2008.01.007. Epub 2008 Jan 20. Micron. 2009. PMID: 18296057

5

Microstructural investigation of nickel silicide thin films and the silicide-silicon interface using transmission electron microscopy.

Bhaskaran M, Sriram S, Mitchell DR, Short KT, Holland AS, Mitchell A. Bhaskaran M, et al. Micron. 2009 Jan;40(1):11-4. doi: 10.1016/j.micron.2008.01.012. Epub 2008 Feb 2. Micron. 2009. PMID: 18337112

6

In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon.

Bhaskaran M, Sriram S, Perova TS, Ermakov V, Thorogood GJ, Short KT, Holland AS. Bhaskaran M, et al. Micron. 2009 Jan;40(1):89-93. doi: 10.1016/j.micron.2008.03.007. Epub 2008 Apr 4. Micron. 2009. PMID: 18467110

7

Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates.

Sriram S, Bhaskaran M, Mitchell DR, Short KT, Holland AS, Mitchell A. Sriram S, et al. Among authors: bhaskaran m. Microsc Microanal. 2009 Feb;15(1):30-5. doi: 10.1017/S1431927609090072. Microsc Microanal. 2009. PMID: 19144255 Free article.

8

In situ investigation of thermally influenced phase transformations in (Pb 0.92 Sr 0.08)(Zr 0.65 Ti 0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction.

Sriram S, Bhaskaran M, Perova TS, Melnikov VA, Holland AS. Sriram S, et al. Among authors: bhaskaran m. IEEE Trans Ultrason Ferroelectr Freq Control. 2009 Feb;56(2):241-5. doi: 10.1109/TUFFC.2009.1032. IEEE Trans Ultrason Ferroelectr Freq Control. 2009. PMID: 19251510

9

Nanocolumnar Preferentially Oriented PSZT Thin Films Deposited on Thermally Grown Silicon Dioxide.

Sriram S, Bhaskaran M, Mitchell A, Mitchell DR, Kostovski G. Sriram S, et al. Among authors: bhaskaran m. Nanoscale Res Lett. 2009 Jan;4(1):29-33. doi: 10.1007/s11671-008-9197-2. Epub 2008 Nov 11. Nanoscale Res Lett. 2009. PMID: 20596364 Free PMC article.

10

Atomically thin layers of MoS2 via a two step thermal evaporation-exfoliation method.

Balendhran S, Ou JZ, Bhaskaran M, Sriram S, Ippolito S, Vasic Z, Kats E, Bhargava S, Zhuiykov S, Kalantar-Zadeh K. Balendhran S, et al. Among authors: bhaskaran m. Nanoscale. 2012 Jan 21;4(2):461-6. doi: 10.1039/c1nr10803d. Epub 2011 Nov 7. Nanoscale. 2012. PMID: 22064926 Free article.

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