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Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range.
Tyaginov S, Bury E, Grill A, Yu Z, Makarov A, De Keersgieter A, Vexler M, Vandemaele M, Wang R, Spessot A, Chasin A, Kaczer B. Tyaginov S, et al. Among authors: spessot a. Micromachines (Basel). 2023 Oct 30;14(11):2018. doi: 10.3390/mi14112018. Micromachines (Basel). 2023. PMID: 38004876 Free PMC article.