Exploring topological defects in epitaxial BiFeO3 thin films.
Vasudevan RK, Chen YC, Tai HH, Balke N, Wu P, Bhattacharya S, Chen LQ, Chu YH, Lin IN, Kalinin SV, Nagarajan V.
Vasudevan RK, et al. Among authors: chu yh.
ACS Nano. 2011 Feb 22;5(2):879-87. doi: 10.1021/nn102099z. Epub 2011 Jan 7.
ACS Nano. 2011.
PMID: 21214267