Upscaling, integration and electrical characterization of molecular junctions.
Van Hal PA, Smits EC, Geuns TC, Akkerman HB, De Brito BC, Perissinotto S, Lanzani G, Kronemeijer AJ, Geskin V, Cornil J, Blom PW, De Boer B, De Leeuw DM.
Van Hal PA, et al. Among authors: perissinotto s.
Nat Nanotechnol. 2008 Dec;3(12):749-54. doi: 10.1038/nnano.2008.305. Epub 2008 Oct 19.
Nat Nanotechnol. 2008.
PMID: 19057596