Müller K - Search Results

1

Bulk and surface excitons in alloyed and phase-separated ZnO-MgO particulate systems.

Zhang H, Gheisi AR, Sternig A, Müller K, Schowalter M, Rosenauer A, Diwald O, Mädler L. Zhang H, et al. Among authors: muller k. ACS Appl Mater Interfaces. 2012 May;4(5):2490-7. doi: 10.1021/am300184b. Epub 2012 May 3. ACS Appl Mater Interfaces. 2012. PMID: 22530613

2

Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis.

Grieb T, Müller K, Fritz R, Schowalter M, Neugebohrn N, Knaub N, Volz K, Rosenauer A. Grieb T, et al. Among authors: muller k. Ultramicroscopy. 2012 Jun;117:15-23. doi: 10.1016/j.ultramic.2012.03.014. Epub 2012 Apr 1. Ultramicroscopy. 2012. PMID: 22634136

3

Conventional transmission electron microscopy imaging beyond the diffraction and information limits.

Rosenauer A, Krause FF, Müller K, Schowalter M, Mehrtens T. Rosenauer A, et al. Among authors: muller k. Phys Rev Lett. 2014 Aug 29;113(9):096101. doi: 10.1103/PhysRevLett.113.096101. Epub 2014 Aug 29. Phys Rev Lett. 2014. PMID: 25215995

4

Scattering amplitudes and static atomic correction factors for the composition-sensitive 002 reflection in sphalerite ternary III-V and II-VI semiconductors.

Schowalter M, Müller K, Rosenauer A. Schowalter M, et al. Among authors: muller k. Acta Crystallogr A. 2012 Jan;68(Pt 1):68-76. doi: 10.1107/S0108767311037779. Epub 2011 Nov 11. Acta Crystallogr A. 2012. PMID: 22186284

5

Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.

Rosenauer A, Gries K, Müller K, Pretorius A, Schowalter M, Avramescu A, Engl K, Lutgen S. Rosenauer A, et al. Among authors: muller k. Ultramicroscopy. 2009 Aug;109(9):1171-82. doi: 10.1016/j.ultramic.2009.05.003. Epub 2009 May 14. Ultramicroscopy. 2009. PMID: 19497670

6

Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy.

Müller K, Rosenauer A, Schowalter M, Zweck J, Fritz R, Volz K. Müller K, et al. Microsc Microanal. 2012 Oct;18(5):995-1009. doi: 10.1017/S1431927612001274. Epub 2012 Oct 2. Microsc Microanal. 2012. PMID: 23026441

7

Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifacts.

Grieb T, Müller K, Fritz R, Grillo V, Schowalter M, Volz K, Rosenauer A. Grieb T, et al. Among authors: muller k. Ultramicroscopy. 2013 Jun;129:1-9. doi: 10.1016/j.ultramic.2013.02.006. Epub 2013 Feb 16. Ultramicroscopy. 2013. PMID: 23542584

8

Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images.

Mehrtens T, Müller K, Schowalter M, Hu D, Schaadt DM, Rosenauer A. Mehrtens T, et al. Among authors: muller k. Ultramicroscopy. 2013 Aug;131:1-9. doi: 10.1016/j.ultramic.2013.03.018. Epub 2013 Apr 6. Ultramicroscopy. 2013. PMID: 23666109

9

Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods.

Krause FF, Müller K, Zillmann D, Jansen J, Schowalter M, Rosenauer A. Krause FF, et al. Among authors: muller k. Ultramicroscopy. 2013 Nov;134:94-101. doi: 10.1016/j.ultramic.2013.05.015. Epub 2013 May 30. Ultramicroscopy. 2013. PMID: 23822882

10

Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM images.

Schowalter M, Stoffers I, Krause FF, Mehrtens T, Müller K, Fandrich M, Aschenbrenner T, Hommel D, Rosenauer A. Schowalter M, et al. Among authors: muller k. Microsc Microanal. 2014 Oct;20(5):1463-70. doi: 10.1017/S1431927614012732. Epub 2014 Jul 10. Microsc Microanal. 2014. PMID: 25010567

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