Soufli R - Search Results

1

Development and calibration of mirrors and gratings for the soft x-ray materials science beamline at the Linac Coherent Light Source free-electron laser.

Soufli R, Fernández-Perea M, Baker SL, Robinson JC, Gullikson EM, Heimann P, Yashchuk VV, McKinney WR, Schlotter WF, Rowen M. Soufli R, et al. Appl Opt. 2012 Apr 20;51(12):2118-28. doi: 10.1364/AO.51.002118. Appl Opt. 2012. PMID: 22534924

2

Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV.

Soufli R, Aquila AL, Salmassi F, Fernández-Perea M, Gullikson EM. Soufli R, et al. Appl Opt. 2008 Sep 1;47(25):4633-9. doi: 10.1364/ao.47.004633. Appl Opt. 2008. PMID: 18758535

3

Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's Solar Dynamics Observatory.

Soufli R, Baker SL, Windt DL, Gullikson EM, Robinson JC, Podgorski WA, Golub L. Soufli R, et al. Appl Opt. 2007 Jun 1;46(16):3156-63. doi: 10.1364/ao.46.003156. Appl Opt. 2007. PMID: 17514269

4

Sub-diffraction-limited multilayer coatings for the 0.3 numerical aperture micro-exposure tool for extreme ultraviolet lithography.

Soufli R, Hudyma RM, Spiller E, Gullikson EM, Schmidt MA, Robinson JC, Baker SL, Walton CC, Taylor JS. Soufli R, et al. Appl Opt. 2007 Jun 20;46(18):3736-46. doi: 10.1364/ao.46.003736. Appl Opt. 2007. PMID: 17538670

5

Triple-wavelength, narrowband Mg/SiC multilayers with corrosion barriers and high peak reflectance in the 25-80 nm wavelength region.

Fernández-Perea M, Soufli R, Robinson JC, Rodríguez-De Marcos L, Méndez JA, Larruquert JI, Gullikson EM. Fernández-Perea M, et al. Among authors: soufli r. Opt Express. 2012 Oct 8;20(21):24018-29. doi: 10.1364/OE.20.024018. Opt Express. 2012. PMID: 23188369 Free article.

6

Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet-soft-x-ray region.

Soufli R, Gullikson EM. Soufli R, et al. Appl Opt. 1997 Aug 1;36(22):5499-507. doi: 10.1364/ao.36.005499. Appl Opt. 1997. PMID: 18259372

7

Absolute Photoabsorption Measurements of Molybdenum in the Range 60-930 eV for Optical Constant Determination.

Soufli R, Gullikson EM. Soufli R, et al. Appl Opt. 1998 Apr 1;37(10):1713-9. doi: 10.1364/ao.37.001713. Appl Opt. 1998. PMID: 18273078

8

Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser.

Hau-Riege SP, London RA, Graf A, Baker SL, Soufli R, Sobierajski R, Burian T, Chalupsky J, Juha L, Gaudin J, Krzywinski J, Moeller S, Messerschmidt M, Bozek J, Bostedt C. Hau-Riege SP, et al. Among authors: soufli r. Opt Express. 2010 Nov 8;18(23):23933-8. doi: 10.1364/OE.18.023933. Opt Express. 2010. PMID: 21164739 Free article.

9

Temporal cross-correlation of x-ray free electron and optical lasers using soft x-ray pulse induced transient reflectivity.

Krupin O, Trigo M, Schlotter WF, Beye M, Sorgenfrei F, Turner JJ, Reis DA, Gerken N, Lee S, Lee WS, Hays G, Acremann Y, Abbey B, Coffee R, Messerschmidt M, Hau-Riege SP, Lapertot G, Lüning J, Heimann P, Soufli R, Fernández-Perea M, Rowen M, Holmes M, Molodtsov SL, Föhlisch A, Wurth W. Krupin O, et al. Among authors: soufli r. Opt Express. 2012 May 7;20(10):11396-406. doi: 10.1364/OE.20.011396. Opt Express. 2012. PMID: 22565760 Free article.

10

Predicting the coherent X-ray wavefront focal properties at the Linac Coherent Light Source (LCLS) X-ray free electron laser.

Barty A, Soufli R, McCarville T, Baker SL, Pivovaroff MJ, Stefan P, Bionta R. Barty A, et al. Among authors: soufli r. Opt Express. 2009 Aug 31;17(18):15508-19. doi: 10.1364/OE.17.015508. Opt Express. 2009. PMID: 19724548 Free article.

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