Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis.
Ruiz-Lopez M, Faenov A, Pikuz T, Ozaki N, Mitrofanov A, Albertazzi B, Hartley N, Matsuoka T, Ochante Y, Tange Y, Yabuuchi T, Habara T, Tanaka KA, Inubushi Y, Yabashi M, Nishikino M, Kawachi T, Pikuz S, Ishikawa T, Kodama R, Bleiner D.
Ruiz-Lopez M, et al. Among authors: mitrofanov a.
J Synchrotron Radiat. 2017 Jan 1;24(Pt 1):196-204. doi: 10.1107/S1600577516016568. Epub 2017 Jan 1.
J Synchrotron Radiat. 2017.
PMID: 28009559