Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences.
Pikuz TA, Faenov AY, Fukuda Y, Kando M, Bolton P, Mitrofanov A, Vinogradov AV, Nagasono M, Ohashi H, Yabashi M, Tono K, Senba Y, Togashi T, Ishikawa T.
Pikuz TA, et al. Among authors: vinogradov av.
Appl Opt. 2013 Jan 20;52(3):509-15. doi: 10.1364/AO.52.000509.
Appl Opt. 2013.
PMID: 23338201