Sriram S - Search Results

1

Elemental analogues of graphene: silicene, germanene, stanene, and phosphorene.

Balendhran S, Walia S, Nili H, Sriram S, Bhaskaran M. Balendhran S, et al. Among authors: sriram s. Small. 2015 Feb 11;11(6):640-52. doi: 10.1002/smll.201402041. Epub 2014 Nov 7. Small. 2015. PMID: 25380184

2

Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.

Bhaskaran M, Sriram S, Holland AS, Evans PJ. Bhaskaran M, et al. Among authors: sriram s. Micron. 2009 Jan;40(1):99-103. doi: 10.1016/j.micron.2007.12.008. Epub 2008 Jan 6. Micron. 2009. PMID: 18276146

3

Influence of oxygen partial pressure on the composition and orientation of strontium-doped lead zirconate titanate thin films.

Sriram S, Bhaskaran M, du Plessis J, Short KT, Sivan VP, Holland AS. Sriram S, et al. Micron. 2009 Jan;40(1):104-8. doi: 10.1016/j.micron.2007.12.009. Epub 2008 Jan 6. Micron. 2009. PMID: 18276147

4

Thin film piezoelectric response characterisation using atomic force microscopy with standard contact mode imaging.

Sriram S, Bhaskaran M, Short KT, Matthews GI, Holland AS. Sriram S, et al. Micron. 2009 Jan;40(1):109-13. doi: 10.1016/j.micron.2008.01.007. Epub 2008 Jan 20. Micron. 2009. PMID: 18296057

5

Microstructural investigation of nickel silicide thin films and the silicide-silicon interface using transmission electron microscopy.

Bhaskaran M, Sriram S, Mitchell DR, Short KT, Holland AS, Mitchell A. Bhaskaran M, et al. Among authors: sriram s. Micron. 2009 Jan;40(1):11-4. doi: 10.1016/j.micron.2008.01.012. Epub 2008 Feb 2. Micron. 2009. PMID: 18337112

6

In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon.

Bhaskaran M, Sriram S, Perova TS, Ermakov V, Thorogood GJ, Short KT, Holland AS. Bhaskaran M, et al. Among authors: sriram s. Micron. 2009 Jan;40(1):89-93. doi: 10.1016/j.micron.2008.03.007. Epub 2008 Apr 4. Micron. 2009. PMID: 18467110

7

Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates.

Sriram S, Bhaskaran M, Mitchell DR, Short KT, Holland AS, Mitchell A. Sriram S, et al. Microsc Microanal. 2009 Feb;15(1):30-5. doi: 10.1017/S1431927609090072. Microsc Microanal. 2009. PMID: 19144255 Free article.

8

In situ investigation of thermally influenced phase transformations in (Pb 0.92 Sr 0.08)(Zr 0.65 Ti 0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction.

Sriram S, Bhaskaran M, Perova TS, Melnikov VA, Holland AS. Sriram S, et al. IEEE Trans Ultrason Ferroelectr Freq Control. 2009 Feb;56(2):241-5. doi: 10.1109/TUFFC.2009.1032. IEEE Trans Ultrason Ferroelectr Freq Control. 2009. PMID: 19251510

9

Surface morphology induced localized electric field and piezoresponse enhancement in nanostructured thin films.

Sriram S, Bhaskaran M, Ahluwalia R, Nguyen TG, Ng N, Srolovitz DJ, Kalantar-Zadeh K, Mitchell A. Sriram S, et al. ACS Nano. 2011 Feb 22;5(2):1067-72. doi: 10.1021/nn103561u. Epub 2011 Jan 27. ACS Nano. 2011. PMID: 21271737

10

Atomically thin layers of MoS2 via a two step thermal evaporation-exfoliation method.

Balendhran S, Ou JZ, Bhaskaran M, Sriram S, Ippolito S, Vasic Z, Kats E, Bhargava S, Zhuiykov S, Kalantar-Zadeh K. Balendhran S, et al. Among authors: sriram s. Nanoscale. 2012 Jan 21;4(2):461-6. doi: 10.1039/c1nr10803d. Epub 2011 Nov 7. Nanoscale. 2012. PMID: 22064926 Free article.

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