Development of a Topological-Insulator-Based Quantum Resistance Standard.
Tran NTM, Rodenbach LK, Underwood JM, Panna AR, Barcikowski ZS, Andersen MP, Zhang P, Tai L, Wang KL, Elmquist RE, Jarrett DG, Newell DB, Goldhaber-Gordon D, Rigosi AF.
Tran NTM, et al. Among authors: underwood jm.
IEEE Trans Instrum Meas. 2024;2024:10.1109/CPEM61406.2024.10646119. doi: 10.1109/CPEM61406.2024.10646119.
IEEE Trans Instrum Meas. 2024.
PMID: 39381778
Free PMC article.