Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays.
Niozu A, Kumagai Y, Nishiyama T, Fukuzawa H, Motomura K, Bucher M, Asa K, Sato Y, Ito Y, Takanashi T, You D, Ono T, Li Y, Kukk E, Miron C, Neagu L, Callegari C, Di Fraia M, Rossi G, Galli DE, Pincelli T, Colombo A, Owada S, Tono K, Kameshima T, Joti Y, Katayama T, Togashi T, Yabashi M, Matsuda K, Nagaya K, Bostedt C, Ueda K.
Niozu A, et al. Among authors: kameshima t.
IUCrJ. 2020 Feb 19;7(Pt 2):276-286. doi: 10.1107/S205225252000144X. eCollection 2020 Mar 1.
IUCrJ. 2020.
PMID: 32148855
Free PMC article.