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Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy.
Pantzas K, Patriarche G, Troadec D, Gautier S, Moudakir T, Suresh S, Largeau L, Mauguin O, Voss PL, Ougazzaden A. Pantzas K, et al. Among authors: patriarche g. Nanotechnology. 2012 Nov 16;23(45):455707. doi: 10.1088/0957-4484/23/45/455707. Epub 2012 Oct 22. Nanotechnology. 2012. PMID: 23089619
Nanoselective area growth of defect-free thick indium-rich InGaN nanostructures on sacrificial ZnO templates.
Puybaret R, Rogers DJ, Gmili YE, Sundaram S, Jordan MB, Li X, Patriarche G, Teherani FH, Sandana EV, Bove P, Voss PL, McClintock R, Razeghi M, Ferguson I, Salvestrini JP, Ougazzaden A. Puybaret R, et al. Among authors: patriarche g. Nanotechnology. 2017 May 12;28(19):195304. doi: 10.1088/1361-6528/aa6a43. Epub 2017 Mar 30. Nanotechnology. 2017. PMID: 28358724
200 results