In situ TEM observation of rebonding on fractured silicon carbide.
Zhang Z , Cui J , Wang B , Jiang H , Chen G , Yu J , Lin C , Tang C , Hartmaier A , Zhang J , Luo J , Rosenkranz A , Jiang N , Guo D .
Zhang Z , et al. Among authors: jiang n, jiang h.
Nanoscale. 2018 Apr 5;10(14):6261-6269. doi: 10.1039/c8nr00341f.
Nanoscale. 2018.
PMID: 29461562