Vella A - Search Results

1

Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation.

Bogdanowicz J, Kumar A, Fleischmann C, Gilbert M, Houard J, Vella A, Vandervorst W. Bogdanowicz J, et al. Among authors: vella a. Ultramicroscopy. 2018 May;188:19-23. doi: 10.1016/j.ultramic.2018.03.001. Epub 2018 Mar 5. Ultramicroscopy. 2018. PMID: 29529555

2

Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporation.

Gilbert M, Vurpillot F, Vella A, Bernas H, Deconihout B. Gilbert M, et al. Among authors: vella a. Ultramicroscopy. 2007 Sep;107(9):767-72. doi: 10.1016/j.ultramic.2007.02.027. Epub 2007 Mar 3. Ultramicroscopy. 2007. PMID: 17399901

3

Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter.

Gault B, Vella A, Vurpillot F, Menand A, Blavette D, Deconihout B. Gault B, et al. Among authors: vella a. Ultramicroscopy. 2007 Sep;107(9):713-9. doi: 10.1016/j.ultramic.2007.02.004. Epub 2007 Feb 28. Ultramicroscopy. 2007. PMID: 17482367

4

Evaporation mechanisms of MgO in laser assisted atom probe tomography.

Mazumder B, Vella A, Deconihout B, Al-Kassab T. Mazumder B, et al. Among authors: vella a. Ultramicroscopy. 2011 May;111(6):571-5. doi: 10.1016/j.ultramic.2010.11.017. Epub 2010 Nov 19. Ultramicroscopy. 2011. PMID: 21159439

5

Coupling atom probe tomography and photoluminescence spectroscopy: exploratory results and perspectives.

Rigutti L, Vella A, Vurpillot F, Gaillard A, Sevelin-Radiguet N, Houard J, Hideur A, Martel G, Jacopin G, De Luna Bugallo A, Deconihout B. Rigutti L, et al. Among authors: vella a. Ultramicroscopy. 2013 Sep;132:75-80. doi: 10.1016/j.ultramic.2013.02.002. Epub 2013 Feb 19. Ultramicroscopy. 2013. PMID: 23489908

6

On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: a review.

Vella A. Vella A. Ultramicroscopy. 2013 Sep;132:5-18. doi: 10.1016/j.ultramic.2013.05.016. Epub 2013 Jun 11. Ultramicroscopy. 2013. PMID: 23822883

7

Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an InGaN/GaN multiquantum well system.

Rigutti L, Blum I, Shinde D, Hernández-Maldonado D, Lefebvre W, Houard J, Vurpillot F, Vella A, Tchernycheva M, Durand C, Eymery J, Deconihout B. Rigutti L, et al. Among authors: vella a. Nano Lett. 2014 Jan 8;14(1):107-14. doi: 10.1021/nl4034768. Epub 2013 Dec 18. Nano Lett. 2014. PMID: 24397602

8

Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms.

Arnoldi L, Silaeva EP, Vurpillot F, Deconihout B, Cadel E, Blum I, Vella A. Arnoldi L, et al. Among authors: vella a. Ultramicroscopy. 2015 Dec;159 Pt 2:139-46. doi: 10.1016/j.ultramic.2014.11.018. Epub 2014 Nov 28. Ultramicroscopy. 2015. PMID: 25484362

9

Effect of the laser pulse width on the field evaporation behavior of metals and oxides.

Wang H, Houard J, Arnoldi L, Hideur A, Silaeva EP, Deconihout B, Vella A. Wang H, et al. Among authors: vella a. Ultramicroscopy. 2016 Jan;160:18-22. doi: 10.1016/j.ultramic.2015.09.009. Epub 2015 Sep 25. Ultramicroscopy. 2016. PMID: 26413936

10

Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles.

Rigutti L, Venturi L, Houard J, Normand A, Silaeva EP, Borz M, Malykhin SA, Obraztsov AN, Vella A. Rigutti L, et al. Among authors: vella a. Nano Lett. 2017 Dec 13;17(12):7401-7409. doi: 10.1021/acs.nanolett.7b03222. Epub 2017 Nov 8. Nano Lett. 2017. PMID: 29095635

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