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Native Point Defect Measurement and Manipulation in ZnO Nanostructures.
Brillson L, Cox J, Gao H, Foster G, Ruane W, Jarjour A, Allen M, Look D, von Wenckstern H, Grundmann M. Brillson L, et al. Among authors: von wenckstern h. Materials (Basel). 2019 Jul 12;12(14):2242. doi: 10.3390/ma12142242. Materials (Basel). 2019. PMID: 31336831 Free PMC article. Review.
Defect segregation and optical emission in ZnO nano- and microwires.
Ruane WT, Johansen KM, Leedy KD, Look DC, von Wenckstern H, Grundmann M, Farlow GC, Brillson LJ. Ruane WT, et al. Among authors: von wenckstern h. Nanoscale. 2016 Apr 14;8(14):7631-7. doi: 10.1039/c5nr08248j. Nanoscale. 2016. PMID: 26987850
23 results