Krause FF - Search Results

1

Precise measurement of the electron beam current in a TEM.

Krause FF, Schowalter M, Oppermann O, Marquardt D, Müller-Caspary K, Ritz R, Simson M, Ryll H, Huth M, Soltau H, Rosenauer A. Krause FF, et al. Ultramicroscopy. 2021 Apr;223:113221. doi: 10.1016/j.ultramic.2021.113221. Epub 2021 Feb 3. Ultramicroscopy. 2021. PMID: 33588232

2

Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods.

Krause FF, Müller K, Zillmann D, Jansen J, Schowalter M, Rosenauer A. Krause FF, et al. Ultramicroscopy. 2013 Nov;134:94-101. doi: 10.1016/j.ultramic.2013.05.015. Epub 2013 May 30. Ultramicroscopy. 2013. PMID: 23822882

3

Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERS.

Juluri RR, Rath A, Ghosh A, Bhukta A, Sathyavathi R, Rao DN, Müller K, Schowalter M, Frank K, Grieb T, Krause F, Rosenauer A, Satyam PV. Juluri RR, et al. Sci Rep. 2014 Apr 10;4:4633. doi: 10.1038/srep04633. Sci Rep. 2014. PMID: 24717601 Free PMC article.

4

Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM images.

Schowalter M, Stoffers I, Krause FF, Mehrtens T, Müller K, Fandrich M, Aschenbrenner T, Hommel D, Rosenauer A. Schowalter M, et al. Among authors: krause ff. Microsc Microanal. 2014 Oct;20(5):1463-70. doi: 10.1017/S1431927614012732. Epub 2014 Jul 10. Microsc Microanal. 2014. PMID: 25010567

5

Conventional transmission electron microscopy imaging beyond the diffraction and information limits.

Rosenauer A, Krause FF, Müller K, Schowalter M, Mehrtens T. Rosenauer A, et al. Among authors: krause ff. Phys Rev Lett. 2014 Aug 29;113(9):096101. doi: 10.1103/PhysRevLett.113.096101. Epub 2014 Aug 29. Phys Rev Lett. 2014. PMID: 25215995

6

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction.

Müller K, Krause FF, Béché A, Schowalter M, Galioit V, Löffler S, Verbeeck J, Zweck J, Schattschneider P, Rosenauer A. Müller K, et al. Among authors: krause ff. Nat Commun. 2014 Dec 15;5:5653. doi: 10.1038/ncomms6653. Nat Commun. 2014. PMID: 25501385 Free PMC article.

7

Homogeneity and composition of AlInGaN: A multiprobe nanostructure study.

Krause FF, Ahl JP, Tytko D, Choi PP, Egoavil R, Schowalter M, Mehrtens T, Müller-Caspary K, Verbeeck J, Raabe D, Hertkorn J, Engl K, Rosenauer A. Krause FF, et al. Ultramicroscopy. 2015 Sep;156:29-36. doi: 10.1016/j.ultramic.2015.04.012. Epub 2015 Apr 25. Ultramicroscopy. 2015. PMID: 25978670

8

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction.

Mahr C, Müller-Caspary K, Grieb T, Schowalter M, Mehrtens T, Krause FF, Zillmann D, Rosenauer A. Mahr C, et al. Among authors: krause ff. Ultramicroscopy. 2015 Nov;158:38-48. doi: 10.1016/j.ultramic.2015.06.011. Epub 2015 Jun 14. Ultramicroscopy. 2015. PMID: 26141289

9

Sample tilt effects on atom column position determination in ABF-STEM imaging.

Zhou D, Müller-Caspary K, Sigle W, Krause FF, Rosenauer A, van Aken PA. Zhou D, et al. Among authors: krause ff. Ultramicroscopy. 2016 Jan;160:110-117. doi: 10.1016/j.ultramic.2015.10.008. Epub 2015 Oct 22. Ultramicroscopy. 2016. PMID: 26479323 Free article.

10

Effects of instrument imperfections on quantitative scanning transmission electron microscopy.

Krause FF, Schowalter M, Grieb T, Müller-Caspary K, Mehrtens T, Rosenauer A. Krause FF, et al. Ultramicroscopy. 2016 Feb;161:146-160. doi: 10.1016/j.ultramic.2015.10.026. Epub 2015 Oct 30. Ultramicroscopy. 2016. PMID: 26686661

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