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Page 1
A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography.
Ling YT, Cools S, Bogdanowicz J, Fleischmann C, Beenhouwer J, Sijbers J, Vandervorst W. Ling YT, et al. Among authors: vandervorst w. Microsc Microanal. 2022 Jan 28:1-14. doi: 10.1017/S1431927621012836. Online ahead of print. Microsc Microanal. 2022. PMID: 35088688
Light absorption in conical silicon particles.
Bogdanowicz J, Gilbert M, Innocenti N, Koelling S, Vanderheyden B, Vandervorst W. Bogdanowicz J, et al. Among authors: vandervorst w. Opt Express. 2013 Feb 11;21(3):3891-6. doi: 10.1364/OE.21.003891. Opt Express. 2013. PMID: 23481845 Free article.
Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefacts.
Melkonyan D, Fleischmann C, Arnoldi L, Demeulemeester J, Kumar A, Bogdanowicz J, Vurpillot F, Vandervorst W. Melkonyan D, et al. Among authors: vandervorst w. Ultramicroscopy. 2017 Aug;179:100-107. doi: 10.1016/j.ultramic.2017.04.006. Epub 2017 Apr 15. Ultramicroscopy. 2017. PMID: 28460266 Free article.
Electrical characterization of single nanometer-wide Si fins in dense arrays.
Folkersma S, Bogdanowicz J, Schulze A, Favia P, Petersen DH, Hansen O, Henrichsen HH, Nielsen PF, Shiv L, Vandervorst W. Folkersma S, et al. Among authors: vandervorst w. Beilstein J Nanotechnol. 2018 Jun 25;9:1863-1867. doi: 10.3762/bjnano.9.178. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 30013880 Free PMC article.
67 results