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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures.
Hönicke P, Kayser Y, Nikolaev KV, Soltwisch V, Scheerder JE, Fleischmann C, Siefke T, Andrle A, Gwalt G, Siewert F, Davis J, Huth M, Veloso A, Loo R, Skroblin D, Steinert M, Undisz A, Rettenmayr M, Beckhoff B. Hönicke P, et al. Small. 2022 Feb;18(6):e2105776. doi: 10.1002/smll.202105776. Epub 2021 Nov 25. Small. 2022. PMID: 34821030
Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers.
Nikolaev KV, Yakunin SN, Makhotkin IA, Rie J, Medvedev RV, Rogachev AV, Trunckin IN, Vasiliev AL, Hendrikx CP, Gateshki M, Kruijs RWEV, Bijkerk F. Nikolaev KV, et al. Acta Crystallogr A Found Adv. 2019 Mar 1;75(Pt 2):342-351. doi: 10.1107/S2053273318017382. Epub 2019 Feb 12. Acta Crystallogr A Found Adv. 2019. PMID: 30821267 Free PMC article.
Laboratory-based 3D X-ray standing-wave analysis of nanometre-scale gratings.
Matveevskii K, Nikolaev KV, Fallica R, Beckers D, Gateshki M, Kharchenko A, Spanjer B, Rogachev A, Yakunin S, Ackermann M, Makhotkin IA. Matveevskii K, et al. Among authors: nikolaev kv. J Appl Crystallogr. 2024 Aug 19;57(Pt 5):1288-1298. doi: 10.1107/S1600576724007179. eCollection 2024 Oct 1. J Appl Crystallogr. 2024. PMID: 39387070 Free PMC article.
135 results