Biskupek J - Search Results

1

Subnanometer-Wide Indium Selenide Nanoribbons.

Cull WJ, Skowron ST, Hayter R, Stoppiello CT, Rance GA, Biskupek J, Kudrynskyi ZR, Kovalyuk ZD, Allen CS, Slater TJA, Kaiser U, Patanè A, Khlobystov AN. Cull WJ, et al. Among authors: biskupek j. ACS Nano. 2023 Mar 28;17(6):6062-6072. doi: 10.1021/acsnano.3c00670. Epub 2023 Mar 14. ACS Nano. 2023. PMID: 36916820 Free PMC article.

2

Improved Tensile Ductility by Severe Plastic Deformation for Nano-Structured Metallic Glass.

Dong Y, Liu S, Biskupek J, Cao Q, Wang X, Jiang JZ, Wunderlich R, Fecht HJ. Dong Y, et al. Among authors: biskupek j. Materials (Basel). 2019 May 16;12(10):1611. doi: 10.3390/ma12101611. Materials (Basel). 2019. PMID: 31100842 Free PMC article.

3

Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms.

Biskupek J, Kaiser U. Biskupek J, et al. J Electron Microsc (Tokyo). 2004;53(6):601-10. doi: 10.1093/jmicro/dfh088. J Electron Microsc (Tokyo). 2004. PMID: 15582973

4

Matrix-dependent structure of GeSi nanocrystals in SiC.

Biskupek J, Kaiser U, Gärtner K. Biskupek J, et al. J Electron Microsc (Tokyo). 2005 Dec;54(6):493-6. doi: 10.1093/jmicro/dfi067. Epub 2005 Dec 22. J Electron Microsc (Tokyo). 2005. PMID: 16373431

5

Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy.

Biskupek J, Kaiser U, Falk F. Biskupek J, et al. J Electron Microsc (Tokyo). 2008 Jun;57(3):83-9. doi: 10.1093/jmicro/dfn008. J Electron Microsc (Tokyo). 2008. PMID: 18504308

6

Selective sputtering and atomic resolution imaging of atomically thin boron nitride membranes.

Meyer JC, Chuvilin A, Algara-Siller G, Biskupek J, Kaiser U. Meyer JC, et al. Among authors: biskupek j. Nano Lett. 2009 Jul;9(7):2683-9. doi: 10.1021/nl9011497. Nano Lett. 2009. PMID: 19480400

7

Identification of magnetic properties of few nm sized FePt crystalline particles by characterizing the intrinsic atom order using aberration corrected S/TEM.

Biskupek J, Jinschek JR, Wiedwald U, Bendele M, Han L, Ziemann P, Kaiser U. Biskupek J, et al. Ultramicroscopy. 2010 Jun;110(7):820-5. doi: 10.1016/j.ultramic.2010.02.043. Epub 2010 Mar 1. Ultramicroscopy. 2010. PMID: 20303666

8

Optimization of STEM tomography acquisition--a comparison of convergent beam and parallel beam STEM tomography.

Biskupek J, Leschner J, Walther P, Kaiser U. Biskupek J, et al. Ultramicroscopy. 2010 Aug;110(9):1231-7. doi: 10.1016/j.ultramic.2010.05.008. Epub 2010 May 20. Ultramicroscopy. 2010. PMID: 20570046

9

Transmission electron microscopy at 20 kV for imaging and spectroscopy.

Kaiser U, Biskupek J, Meyer JC, Leschner J, Lechner L, Rose H, Stöger-Pollach M, Khlobystov AN, Hartel P, Müller H, Haider M, Eyhusen S, Benner G. Kaiser U, et al. Among authors: biskupek j. Ultramicroscopy. 2011 Jul;111(8):1239-46. doi: 10.1016/j.ultramic.2011.03.012. Epub 2011 Apr 1. Ultramicroscopy. 2011. PMID: 21801697

10

Self-assembly of a sulphur-terminated graphene nanoribbon within a single-walled carbon nanotube.

Chuvilin A, Bichoutskaia E, Gimenez-Lopez MC, Chamberlain TW, Rance GA, Kuganathan N, Biskupek J, Kaiser U, Khlobystov AN. Chuvilin A, et al. Among authors: biskupek j. Nat Mater. 2011 Aug 7;10(9):687-92. doi: 10.1038/nmat3082. Nat Mater. 2011. PMID: 21822259

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