Nanoscale characterization of TiO(2) films grown by atomic layer deposition on RuO(2) electrodes.
Murakami K, Rommel M, Hudec B, Rosová A, Hušeková K, Dobročka E, Rammula R, Kasikov A, Han JH, Lee W, Song SJ, Paskaleva A, Bauer AJ, Frey L, Fröhlich K, Aarik J, Hwang CS.
Murakami K, et al. Among authors: kasikov a.
ACS Appl Mater Interfaces. 2014 Feb 26;6(4):2486-92. doi: 10.1021/am4049139. Epub 2014 Feb 10.
ACS Appl Mater Interfaces. 2014.
PMID: 24483129