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Single-cavity loss-enabled nanometrology.
Xu J, Mao Y, Li Z, Zuo Y, Zhang J, Yang B, Xu W, Liu N, Deng ZJ, Chen W, Xia K, Qiu CW, Zhu Z, Jing H, Liu K. Xu J, et al. Among authors: liu k, liu n. Nat Nanotechnol. 2024 Oct;19(10):1472-1477. doi: 10.1038/s41565-024-01729-8. Epub 2024 Jul 17. Nat Nanotechnol. 2024. PMID: 39020101
Depth-of-Discharge Dependent Capacity Decay Induced by the Accumulation of Oxidized Lattice Oxygen in Li-Rich Layered Oxide Cathode.
Zhang K, Chen Y, Zhu Y, Zheng Q, Tang Y, Yu D, Liu Q, Luo H, Yin J, Zeng L, Jiao W, Liu N, Wang Q, Zheng L, Zhang J, Wang Y, Zhang B, Yan Y, Huang H, Shen CH, Qiao Y, Sun SG. Zhang K, et al. Among authors: liu n. Angew Chem Int Ed Engl. 2024 Nov 28:e202419909. doi: 10.1002/anie.202419909. Online ahead of print. Angew Chem Int Ed Engl. 2024. PMID: 39606829
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