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A new TCAD simulation method for direct CMOS electron detectors optimization.
Marcelot O, Marcelot C, Corbière F, Martin-Gonthier P, Estribeau M, Houdellier F, Rolando S, Pertel C, Goiffon V. Marcelot O, et al. Among authors: goiffon v. Ultramicroscopy. 2023 Jan;243:113628. doi: 10.1016/j.ultramic.2022.113628. Epub 2022 Oct 27. Ultramicroscopy. 2023. PMID: 36371857
Smart CMOS image sensor for lightning detection and imaging.
Rolando S, Goiffon V, Magnan P, Corbière F, Molina R, Tulet M, Bréart-de-Boisanger M, Saint-Pé O, Guiry S, Larnaudie F, Leone B, Perez-Cuevas L, Zayer I. Rolando S, et al. Among authors: goiffon v. Appl Opt. 2013 Mar 1;52(7):C16-23. doi: 10.1364/AO.52.000C16. Appl Opt. 2013. PMID: 23458812 Free article.
Vulnerability of CMOS image sensors in Megajoule Class Laser harsh environment.
Goiffon V, Girard S, Chabane A, Paillet P, Magnan P, Cervantes P, Martin-Gonthier P, Baggio J, Estribeau M, Bourgade JL, Darbon S, Rousseau A, Glebov VY, Pien G, Sangster TC. Goiffon V, et al. Opt Express. 2012 Aug 27;20(18):20028-42. doi: 10.1364/OE.20.020028. Opt Express. 2012. PMID: 23037056 Free article.
15 results