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Page 1
Unprecedented Piezoresistance Coefficient in Strained Silicon Carbide.
Cui J, Zhang Z, Liu D, Zhang D, Hu W, Zou L, Lu Y, Zhang C, Lu H, Tang C, Jiang N, Parkin IP, Guo D. Cui J, et al. Among authors: tang c. Nano Lett. 2019 Sep 11;19(9):6569-6576. doi: 10.1021/acs.nanolett.9b02821. Epub 2019 Aug 7. Nano Lett. 2019. PMID: 31381357
In situ TEM observation of rebonding on fractured silicon carbide.
Zhang Z , Cui J , Wang B , Jiang H , Chen G , Yu J , Lin C , Tang C , Hartmaier A , Zhang J , Luo J , Rosenkranz A , Jiang N , Guo D . Zhang Z , et al. Among authors: tang c. Nanoscale. 2018 Apr 5;10(14):6261-6269. doi: 10.1039/c8nr00341f. Nanoscale. 2018. PMID: 29461562
Baseline Nodal Status on 68Ga-PSMA-11 Positron Emission Tomography/Computed Tomography in Men with Intermediate- to High-risk Prostate Cancer Is Prognostic for Treatment Failure: Follow-up of the proPSMA Trial.
Hofman MS, Kasivisvanathan V, Link E, Buteau J, Roberts MJ, Francis RJ, Tang C, Vela I, Thomas P, Rutherford N, Martin JM, Frydenberg M, Shakher R, Wong LM, Taubman K, Ting Lee S, Hsiao E, Roach P, Nottage M, Kirkwood I, Hayne D, Iravani A, Williams S, O'Brien J, Lawrentschuk N, Murphy DG. Hofman MS, et al. Among authors: tang c. Eur Urol Oncol. 2024 Nov 28:S2588-9311(24)00251-7. doi: 10.1016/j.euo.2024.11.006. Online ahead of print. Eur Urol Oncol. 2024. PMID: 39613566
Internal Control Quality and Boardroom Backscratching.
Huang L, Tang C, Li M. Huang L, et al. Among authors: tang c. Eval Rev. 2024 Nov 29:193841X241304134. doi: 10.1177/0193841X241304134. Online ahead of print. Eval Rev. 2024. PMID: 39612509
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