Machine-Learning Mental-Fatigue-Measuring μm-Thick Elastic Epidermal Electronics (MMMEEE).
Liu H, Li H, Wang Y, Liu Y, Xiao L, Guo W, Lin Y, Wang H, Wang T, Yan H, Lai S, Chen Y, Mou Z, Chen L, Luo Y, Liu GS, Zhang X.
Liu H, et al. Among authors: yan h.
Nano Lett. 2024 Nov 27. doi: 10.1021/acs.nanolett.4c02474. Online ahead of print.
Nano Lett. 2024.
PMID: 39604089